发明名称 |
SYSTEM FOR DETECTING WAFER OF STEPPER LOADER |
摘要 |
PURPOSE: A wafer detection system of a stepper loader is provided to exactly detect a wafer mounted in a carrier irrespective of the influence of a robot arm and a driving motor. CONSTITUTION: The wafer detection system comprises a wafer detection sensor(30), a digital logic circuit generator(34) and a controller(32). The wafer detection sensor(30) includes a pair of light emitting and light receiving devices and detects a wafer(W) in a carrier(K) by transmitting and receiving IRs(Infrared Rays). If an analog signal inputs from the wafer detection sensor(30), the digital logic circuit generator(34) generates a clock signal for confirming whether the wafer exists based on stored logic data. The controller(32) determines whether the wafer(W) exists in the carrier by calculating the clock signal.
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申请公布号 |
KR20020076876(A) |
申请公布日期 |
2002.10.11 |
申请号 |
KR20010017066 |
申请日期 |
2001.03.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, IN SUN |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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