Semiconductor integrated circuit and test board

摘要

In the semiconductor integrated circuit the test controller generates test patterns for all the pins from test patterns for only pins necessary for the test. The test controller receives information on pins to be tested and first input test patterns constructed by input values and output expectation values for the pins to be tested. The test controller sets the input values or output expectation values of pins which are not to be tested to predetermined values and thereby generates a second input test pattern in which the input values or output expectation values of all the pins are set. The second input pattern is provided to the core logic. The output test pattern is obtained in exactly the reverse order.