发明名称 INTEGRATED CIRCUIT STRUCTURE
摘要 <p>An integrated circuit structure, wherein boron nitride films are provided as protective films (34) between inter-layer insulation films (33) with a low dielectric constant formed of organic coated films or porous films so as to form an inter-layer insulation multi-layer film, whereby, since the inter-layer insulation films (33) with a low dielectric constant are combined with the boron nitride films with excellent mechanical and chemical resistances, high heat conductivity, and low dielectric constant, a reduction in dielectric constant can be achieved in such a state that adhesiveness and hygroscopic resistance are maintained.</p>
申请公布号 WO02080258(A1) 申请公布日期 2002.10.10
申请号 WO2002JP03073 申请日期 2002.03.28
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD.;SAKAMOTO, HITOSHI;UEDA, NORIAKI;SUGINO, TAKASHI 发明人 SAKAMOTO, HITOSHI;UEDA, NORIAKI;SUGINO, TAKASHI
分类号 C23C16/38;H01L21/31;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/314 主分类号 C23C16/38
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