发明名称 |
INTEGRATED CIRCUIT STRUCTURE |
摘要 |
<p>An integrated circuit structure, wherein boron nitride films are provided as protective films (34) between inter-layer insulation films (33) with a low dielectric constant formed of organic coated films or porous films so as to form an inter-layer insulation multi-layer film, whereby, since the inter-layer insulation films (33) with a low dielectric constant are combined with the boron nitride films with excellent mechanical and chemical resistances, high heat conductivity, and low dielectric constant, a reduction in dielectric constant can be achieved in such a state that adhesiveness and hygroscopic resistance are maintained.</p> |
申请公布号 |
WO02080258(A1) |
申请公布日期 |
2002.10.10 |
申请号 |
WO2002JP03073 |
申请日期 |
2002.03.28 |
申请人 |
MITSUBISHI HEAVY INDUSTRIES, LTD.;SAKAMOTO, HITOSHI;UEDA, NORIAKI;SUGINO, TAKASHI |
发明人 |
SAKAMOTO, HITOSHI;UEDA, NORIAKI;SUGINO, TAKASHI |
分类号 |
C23C16/38;H01L21/31;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/314 |
主分类号 |
C23C16/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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