Test arrangement for electronic units has mechanical drive for moving first plate towards second to bring contact points in contact with needles, vacuum chamber, seal and vacuum pump

摘要

The arrangement has attachment devices holding electronic units under test, a first replaceable plate (24), a second replaceable plate (6) with a needle field (38) with needles (40) opposite electronic unit (30) contact points (42) and leadthroughs, a connector (46) for a test cassette (16), a mechanical drive for moving the first plate towards the second to contact the contact points with the needles, a vacuum chamber (4), seal (22) and pump. An Independent claim is also included for a method of testing an electronic unit.