Integrated circuit, especially memory component, has at least two test circuits that can be connected to connector field via selection switch

摘要

The device has components, test circuits for testing the quality of the IC and a connector field for connecting to the test circuits. At least two test circuits can be connected to the connector field via a selection switch. The selection switch (9) is in the form of transistors (15-20), with two parallel switches (15,16) with inputs connected to a first connecting line and outputs to test circuits.