| 摘要 |
To provide a semiconductor integrated circuit device enabled to perform an IDDQ test quickly even when the leakage current increases due to the shrinking of the circuits of the device, the semiconductor integrated circuit device is divided into a plurality of circuit blocks, the device being provided with a signal generator so that the signal generator used to compare the supply current in each of the blocks in the quiescent state with that of another block to distinguish a block having the large supply current that exceeds a predetermined value among said plurality of circuit blocks, thereby generating a signal denoting the distinguished circuit block. |
