发明名称 SUPPRESSION OF N-TYPE AUTODOPING IN LOW-TEMPERATURE SI AND SIGE EPITAXY
摘要 <p>A method of manufacturing a semiconductor device, which method comprises the step of epitaxially growing a stack comprising an n-type doped layer of a semiconductor material followed by at least one further layer of a semiconductor material, the stack being grown in one continuous growth cycle.</p>
申请公布号 WO2002079551(A1) 申请公布日期 2002.10.10
申请号 IB2002000640 申请日期 2002.03.04
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