发明名称 |
METHOD FOR IMPROVING COPPER THIN FILM ADHESION TO METAL NITRIDE SUBSTRATE BY ADDITION OF WATER |
摘要 |
PURPOSE: A method for improving copper thin film adhesion to a metal nitride substrate by addition of water is provided to form a thin copper seed layer, increase a deposition rate and reduce resistivity of a deposited thin film by implanting a proper quantity of vapor into the surface of a wafer. CONSTITUTION: The wafer(28) is inserted into a chemical vapor deposition(CVD) chamber(20). Moisture is added to helium gas(16) to form wet helium gas(22) that is used as an atmosphere in the CVD chamber. A copper seed layer is deposited in a flow rate of the wet helium gas from 5.0 sccm to 20.0 sccm while the temperature of the wafer is increased from an ambient temperature to a temperature of 150-230 deg.C. The copper thin film is deposited at a temperature of 150-230 deg.C and in a flow rate of the wet helium gas from 0.2 sccm to 1.0 sccm.
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申请公布号 |
KR20020076180(A) |
申请公布日期 |
2002.10.09 |
申请号 |
KR20020016476 |
申请日期 |
2002.03.26 |
申请人 |
SHARP CORPORATION |
发明人 |
EVANS DAVID RUSSELL;HSU SHENG TENG;ZHUANG WEIWEI |
分类号 |
C23C16/455;C23C16/18;G01Q30/08;H01L21/205;H01L21/285;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/455 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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