发明名称 METHOD AND DEVICE FOR MEASURING PATTERN
摘要 PROBLEM TO BE SOLVED: To measure a pattern provided with a plurality of linear areas. SOLUTION: This device is provided with an image acquiring part 21 for acquiring the image of a fine pattern formed on a sample, an edge point extracting part 22 for extracting a plurality of edge points in the fine pattern from the image acquired by this image acquiring part, an edge point dividing part 23 for dividing a plurality of extracted edge points into a plurality of groups with a dividing point as a boundary and a form measuring part 24 for measuring the form of the pattern while using the edge points included in each of groups divided by this edge point dividing part.
申请公布号 JP2002296761(A) 申请公布日期 2002.10.09
申请号 JP20010097117 申请日期 2001.03.29
申请人 TOSHIBA CORP 发明人 MIYANO YUMIKO
分类号 G01B11/00;G01B11/02;G01B11/28;G01B15/00;G03F1/36;G03F1/84;G06T1/00;G06T7/60;H01L21/027 主分类号 G01B11/00
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