发明名称 CHEMICAL AMPLIFICATION TYPE POSITIVE RESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a chemical amplification type positive resist composition containing a resin component and an acid generating agent and suitable for excimer laser lithography with ArF or KrF laser and to provide a composition showing excellent balance in performances of resolution, profile, sensitivity, durability against dry etching, adhesion property or the like. SOLUTION: The chemical amplification type positive resist composition contains a resin which has polymerization units (A), (B), (C) and which is insoluble with alkali but becomes alkali-soluble by the effect of acids, and an acid generating agent. The unit (A) is at least one kind of polymerization unit selected from polymerization units expressed by formulae (Ia) and (Ib). The unit (B) is at least one kind of polymerization unit selected from polymerization unit expressed by formula (II), polymerization units consisting of polymerization units expressed by formula (III) and polymerization units derived from maleic acid anhydride or itaconic acid anhydride, and polymerization units expressed by formula (IV). The unit (C) is a polymerization unit which becomes alkali- soluble by separating a part of group by the effect of acids.
申请公布号 JP2002296783(A) 申请公布日期 2002.10.09
申请号 JP20010104302 申请日期 2001.04.03
申请人 SUMITOMO CHEM CO LTD 发明人 KAMIYA YASUNORI;YAMADA AIRI;MIYA YOSHIKO;TAKADA YOSHIYUKI
分类号 G03F7/039;C08F220/18;C08F220/28;C08F222/04;C08F232/04;C08K5/00;C08K5/17;C08L33/06;C08L33/14;C08L35/00;C08L45/00;H01L21/027 主分类号 G03F7/039
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