| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a resin measuring chip used for a surface plasmon resonance measuring device for detecting the state of surface plasmon resonance by measuring the intensity of the light beam totally reflected at the interface of a dielectric block and a metal film which is formed so as not to result in S/N lowing of the signal detecting the state of surface plasmon resonance. SOLUTION: The measuring chip used for the surface plasmon resonance measuring device is provided with a dielectric block 11, a metal film 12 formed on its one face, an optical system 32 impinging the light beam 30 onto the dielectric block 11 at various angles so as to obtain total reflection condition at an interface 11a between the dielectric block 11 and the metal film 12, and a light detecting means 40 for measuring the intensity of the light beam 30 totally reflected at the interface 11a. The dielectric block 11 is made of the resin having the property that when the light beam 30 p-polarized at the outside of the block is made incident to the interface 11a, the intensity of the s-polarized component at the interface 11a is less than 50% of the intensity of the light beam 30 before incident.</p> |
