发明名称 |
METHOD FOR FORMING POLYCRYSTALLINE SEMICONDUCTOR THIN- FILM, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND APPARATUS FOR CARRYING OUT THESE METHODS |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method and an apparatus which can easily form a thin film of a semiconductor such as polycrystalline silicon having high crystallization rate and high quality, on a large area and at a low cost. SOLUTION: The method for obtaining the polycrystalline semiconductor thin-film 7 comprises forming an amorphous or a microcrystalline silicon thin- film 100A containing granular products of SiOx or/and SiNy, on a substrate 1, by a catalytic CVD method or the like; etching the amorphous constituents by reacting the silicon thin film 100A with the hydrogen active species which are generated by means of contacting hydrogen gas or hydrogen-including gas with a heated catalyzer body 46 (by bias catalytic AHA(Atomic Hydrogen Anneal) treatment); further forming a layer 100B of silicon ultra-fine particles through precipitating the ultra-fine particles of silicon out of SiOx or/and SiNy; and growing a polycrystalline semiconductor thin-film on the above seeds by the catalytic CVD method or the like (by further repeating the catalytic AHA treatment and the catalytic CVD or the like).</p> |
申请公布号 |
JP2002294451(A) |
申请公布日期 |
2002.10.09 |
申请号 |
JP20010098313 |
申请日期 |
2001.03.30 |
申请人 |
SONY CORP |
发明人 |
YAMANAKA HIDEO;YAMOTO HISAYOSHI |
分类号 |
G02F1/1368;C23C16/02;C23C16/24;G09F9/30;H01J9/02;H01L21/20;H01L21/205;H01L21/336;H01L27/08;H01L27/32;H01L29/786;H01L31/04;(IPC1-7):C23C16/24;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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