发明名称 X-RAY INSPECTION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device and its method, capable of decreasing the inspection time in the case where vertical photographing and slanting photographing are jointly conducted. SOLUTION: One orthogonal direction X-ray generator for irradiating X-rays to a joint part along the orthogonal direction to a circuit forming body is installed, and a slanting direction X-ray generator for irradiating X-rays to the joint part along the previously fixed slanting direction is also installed. Therefore, the time required for slanting the X-ray generator can be omitted, and the orthogonal X-ray generator and the slanting direction X-ray generator can be changed over in a shorter time than the conventional method. The inspection of the joint part in the circuit forming body can be conducted in a short time.
申请公布号 JP2002296204(A) 申请公布日期 2002.10.09
申请号 JP20010099332 申请日期 2001.03.30
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ICHIHARA MASARU;SATO KENICHI;YOSHINO SHINJI;KUBOTA HARUKO
分类号 G01N23/04;H05K3/34;(IPC1-7):G01N23/04 主分类号 G01N23/04
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