发明名称 |
X-RAY INSPECTION DEVICE AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device and its method, capable of decreasing the inspection time in the case where vertical photographing and slanting photographing are jointly conducted. SOLUTION: One orthogonal direction X-ray generator for irradiating X-rays to a joint part along the orthogonal direction to a circuit forming body is installed, and a slanting direction X-ray generator for irradiating X-rays to the joint part along the previously fixed slanting direction is also installed. Therefore, the time required for slanting the X-ray generator can be omitted, and the orthogonal X-ray generator and the slanting direction X-ray generator can be changed over in a shorter time than the conventional method. The inspection of the joint part in the circuit forming body can be conducted in a short time.
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申请公布号 |
JP2002296204(A) |
申请公布日期 |
2002.10.09 |
申请号 |
JP20010099332 |
申请日期 |
2001.03.30 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ICHIHARA MASARU;SATO KENICHI;YOSHINO SHINJI;KUBOTA HARUKO |
分类号 |
G01N23/04;H05K3/34;(IPC1-7):G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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主权项 |
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地址 |
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