发明名称 Exposure method, exposure apparatus and semiconductor manufacturing apparatus
摘要 An exposure apparatus for exposing a photosensitive substrate to a pattern on a mask within an exposure view angle to transfer the pattern onto the photosensitive substrate using X-ray as exposure radiation, wherein exposure light on the mask is limited by a light blocking plate for blocking the exposure radiation, thus accomplishing efficient manufacturing of the semiconductor devices.
申请公布号 US6463119(B1) 申请公布日期 2002.10.08
申请号 US20000589812 申请日期 2000.06.09
申请人 CANON KABUSHIKI KAISHA 发明人 TERASHIMA SHIGERU;MIYACHI TAKESHI;WATANABE YUTAKA;KASUMI KAZUYUKI
分类号 H01L21/027;G03F7/20;(IPC1-7):G21K5/00 主分类号 H01L21/027
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