发明名称 Refresh-type memory with zero write recovery time and no maximum cycle time
摘要 A semiconductor memory device and method for its operation are disclosed. The memory device uses refresh-type memory cells, but operates within the same timing parameters as an SRAM. A refreshing operation and a successful read/write operation can both be performed in a read/write cycle, with zero write recovery time. But if the read/write cycle goes long, multiple refreshing operations can also be performed during the read/write cycle. Thus the device operates with no maximum write cycle time limitation.In the disclosed method, an external write command causes the device to store the write address and data to registers instead of to the memory cell array. When the external write command signals that data is present, zero write recovery time is needed, since the registers require no address setup time. Because the memory cell array is not involved in this transaction, refresh operations can proceed as needed during the external write command, no matter how long the external write takes to complete. At a convenient time after the end of the external write command (e.g., during the next external write command), a short pulsed write operation transfers the data to the memory cell array.
申请公布号 US6463002(B2) 申请公布日期 2002.10.08
申请号 US20010803064 申请日期 2001.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM CHANG-RAE;PARK JONG-YUL;CHUNG MIN-CHUL;HAN SANG-JIB
分类号 G11C11/403;G11C11/406;G11C11/408;G11C11/409;(IPC1-7):G11C7/00 主分类号 G11C11/403
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