发明名称 LPCVD furnace uniformity improvement by temperature ramp down deposition system
摘要 A new method is provided for the application of Chemical Vapor Deposition (CVD) processes. Where conventional CVD processes are performed while maintaining one, constant temperature during the CVD process, from the start of the CVD process up to the point where the CVD process is completed, the invention provides for first raising the temperature to a processing temperature and then gradually reducing the applied temperature within the cycle time that is required for the completion of the CVD process.
申请公布号 US6461979(B1) 申请公布日期 2002.10.08
申请号 US20020075841 申请日期 2002.02.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 LIN CHIH-HAO;CHEN BU-FANG;ZHUANG XI-SHENG;CHEN SONG-FU
分类号 C23C16/46;H01L21/318;(IPC1-7):H01L21/31;H01L21/469 主分类号 C23C16/46
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