发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to reduce a contact resistance and a leakage current and to prevent an etch of a contact plug due to misalignment by using double contact plugs. CONSTITUTION: An interlayer dielectric(101) is formed on a semiconductor substrate(100). A contact hole is formed by selectively etching the interlayer dielectric(101). A contact plug(205) stacked sequentially a lower plug(103) and an upper plug(104) is formed in the contact hole. After forming an upper conductive layer on the resultant structure, a metal interconnection(107) is formed by selectively etching the upper conductive layer.
|
申请公布号 |
KR20020075003(A) |
申请公布日期 |
2002.10.04 |
申请号 |
KR20010015154 |
申请日期 |
2001.03.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYEONG YUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|