发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a method for manufacturing the same are provided to reduce a contact resistance and a leakage current and to prevent an etch of a contact plug due to misalignment by using double contact plugs. CONSTITUTION: An interlayer dielectric(101) is formed on a semiconductor substrate(100). A contact hole is formed by selectively etching the interlayer dielectric(101). A contact plug(205) stacked sequentially a lower plug(103) and an upper plug(104) is formed in the contact hole. After forming an upper conductive layer on the resultant structure, a metal interconnection(107) is formed by selectively etching the upper conductive layer.
申请公布号 KR20020075003(A) 申请公布日期 2002.10.04
申请号 KR20010015154 申请日期 2001.03.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYEONG YUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址