发明名称 REPAIR CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A repair circuit of a semiconductor memory device is provided to output stably a repair signal regardless of noise by adding a precharge stabilization portion to the repair circuit. CONSTITUTION: A precharge signal input portion(10) is used for precharging supply voltage in response to a precharge signal. A fuse portion(20) is connected with an output terminal of the precharge signal input portion(10) in order to protect circuits from over-current. An address signal input portion(30) is connected between the fuse portion(20) and a ground terminal and is turned according to an input state of defected address in order to support a programming operation of the fuse portion(20) or confirm a state of programming. An output portion(40) outputs the programming state of the fuse portion(20) according to a signal of the address signal input portion(30). A latch portion(50) is used for stabilizing an output value of the output portion(40). A precharge stabilization portion(60) is connected with the fuse portion(20) in order to precharge the fuse portion(20) when the precharge signal and the address signal are not in active states.
申请公布号 KR20020074574(A) 申请公布日期 2002.10.04
申请号 KR20010014413 申请日期 2001.03.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, WON JUN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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