发明名称 INTEGRATED CIRCUIT STRUCTURE
摘要 <p>PROBLEM TO BE SOLVED: To provide an integrated circuit structure that can provide low relative permittivity. SOLUTION: The low relative permittivity can be achieved by forming an interlayer insulating multilayer by providing boron nitride films as protective films 34 between interlayer insulating films 33 each having low relative permittivity, being made of an organic coating film or a porous film, and by combining the interlayer insulating films 34 having low relative permittivity and the boron nitride films having excellent properties such as superior resistance to mechanical and chemical impacts, high thermal conductivity and low relative permittivity in a state in which firm adhesion and low hygroscopicity are maintained.</p>
申请公布号 JP2002289617(A) 申请公布日期 2002.10.04
申请号 JP20010093501 申请日期 2001.03.28
申请人 MITSUBISHI HEAVY IND LTD;SUGINO TAKASHI 发明人 SAKAMOTO HITOSHI;UEDA NORIAKI;SUGINO TAKASHI
分类号 C23C16/38;H01L21/31;H01L21/318;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/318 主分类号 C23C16/38
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