发明名称 SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate processing apparatus that can shorten a temperature rising/falling time, increase wafer processing throughput per unit hour, and offer a high quality wafer. SOLUTION: Pipelines 13 and 14 are formed separately so that either first gas (N2 gas) or second gas (He gas) having larger thermal conductivity than the first gas can be introduced into a process chamber selectively. Valve means (a first open/shut valve 16, a second open/shut valve 18) are formed in the pipelines 13, 14 to switch the first gas and the second gas and introduce the switched gas into the process chamber, and those valve means are controlled by a gas switching controller 22 so that the second gas (He gas) flows into the process chamber at least during the temperature rising/falling period.
申请公布号 JP2002289602(A) 申请公布日期 2002.10.04
申请号 JP20010090975 申请日期 2001.03.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TOMEZUKA KOJI
分类号 C23C16/455;H01L21/205;H01L21/22;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/455
代理机构 代理人
主权项
地址