发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device capable of minimizing a size of a cell and capable of the low power consumption in program operation, and to provide its manufacturing method. SOLUTION: A charge save area, a control gate and a select gate are formed on a substrate. The control gate 512' has a spacer shape, and the spacer 528 on a source side is located on the side wall of the charge save area and the control gate 512'. Further, a LDD spacer 540 is formed on the side wall of the select gate 506, and a drain diffusion region has a LDD structure with a HALO region 536. These regions are formed by repeatedly performing self- alignment.</p> |
申请公布号 |
JP2002289714(A) |
申请公布日期 |
2002.10.04 |
申请号 |
JP20020020746 |
申请日期 |
2002.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM DONG-JUN;KIM JIN-HO;LEE YOUNG KYU;CHO MIN SOO;RYU EUI YOUL |
分类号 |
H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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