SEMICONDUCTOR STORAGE DEVICE, ITS TEST METHOD, AND REDUNDANCY SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor storage device in which test technology and redundancy technology can be optimized in a high dimension. SOLUTION: This device is provided with an array control circuit 12 which stops the operation of a defective element by receiving no word line state signal WLE based on signals HITL, HITR for deciding whether row redundancy replacement is performed or not, and the circuit inputs the word line state signal to a plurality of memory blocks 11A-0 to 11A-31, 11B-0 to 11B-31 through a single signal line 13-1. Since a signal having redundancy information is decoded locally, the number of arrays activated simultaneously can be increased and a test time can be shortened.