发明名称 METHOD FOR PRODUCING GaN-BASED SEMICONDUCTOR CRYSTAL AND GaN-BASED SEMICONDUCTOR BASIC MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a method for producing a high quality GaN-based crystal, and a GaN-based semiconductor basic material in which a high quality GaN- based crystal can be grown by that method. SOLUTION: Protrusions and recesses (or a level difference) 1a are formed on the surface of a crystal substrate 1 composed of a material different from a GaN-based semiconductor and a GaN-based crystal 2 is grown directly on the surface where protrusions and recesses are formed with no intermediary of a low temperature GaN-based buffer layer thus obtaining a GaN-based crystal layer 3. Lateral growth of the GaN-based crystal is suppressed by the protrusions and recesses (or a level difference) on the surface of the crystal substrate and the surface is planarized with no intermediary of the buffer layer.
申请公布号 JP2002289540(A) 申请公布日期 2002.10.04
申请号 JP20010091129 申请日期 2001.03.27
申请人 MITSUBISHI CABLE IND LTD 发明人 TADATOMO KAZUYUKI;OKAGAWA HIROAKI
分类号 H01L21/205;H01L33/06;H01L33/12;H01L33/16;H01L33/22;H01L33/32;H01S5/323;H01S5/343 主分类号 H01L21/205
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