发明名称 TEST PATTERN FORMING SYSTEM AND FORMING METHOD FOR TEST PATTERN USED THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a test pattern forming system, where the test pattern can be immediately used for the simulation by carrying out simulation, in an environment which approximates actual operation. SOLUTION: In the system, a measurement device for the detection of the generation of SDH/SONET obstacles and a digital transmitting device 2 are connected, facing each other through optical fiber transmitting paths 201 and 202, a main signal data accumulating device 3 is inserted to the optical fiber transmitting path 201 and a simulator 4 is connected to the main signal data accumulating device 3. Received main signal data are processed by a main signal processing part 31 of the main signal data accumulating device 3, and the processed main signal data are temporary stored in a data storing part 32. The stored main signal data is converted into a text file, which is usable in the test pattern formation for the simulator 4 by a data processing part 33.
申请公布号 JP2002288260(A) 申请公布日期 2002.10.04
申请号 JP20010091557 申请日期 2001.03.28
申请人 NEC MIYAGI LTD 发明人 KATAOKA KAORU
分类号 G01R31/3183;G01R31/28;G01R31/319;G06F11/22;G06F11/26;G06F17/50;H01L21/82;H04L29/14 主分类号 G01R31/3183
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