发明名称 NEUTRAL PARTICLE BEAM TREATMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a neutral beam treatment device which can apply a large- bore beam to a substance to be treated with low-cost and compact constitution, and enables processing such as highly accurate etching, film growth, etc. without damaging the substance to be treated. SOLUTION: This neutral particle beam treatment device is equipped with a treatment gas introduction port 11 which leads in treatment gas into a vacuum chamber, a plasma generation chamber 2 which generates positive ions and electrons from the led in treatment gas, a negative gas generation chamber 3 which generates negative ions by electrons generated in the plasma generation chamber 2 adhering to remaining gas, an ion extraction means 4 which draws out the above positive ions or negative ions and accelerates them in specified direction, and a neutralizing means 5 which forms a neutral particle beam by neutralizing the ion beam generated by the ion extraction means. This applies the neutral particle beam generated by the neutralizing means 5 to the substance X to be treated.
申请公布号 JP2002289585(A) 申请公布日期 2002.10.04
申请号 JP20010088898 申请日期 2001.03.26
申请人 EBARA CORP 发明人 ICHIKI KATSUNORI;YAMAUCHI KAZUO;HIYAMA HIROKUNI;SAGAWA SEIJI
分类号 G21K5/04;B01J19/08;C23C14/32;C23C16/50;H01J37/317;H01J37/32;H01L21/205;H01L21/302;H01L21/304;H01L21/3065;H05H1/46 主分类号 G21K5/04
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