发明名称 METHOD AND APPARATUS FOR DETECTION OF DEFECTS USING LOCALIZED HEAT INJECTION OF SHORT LASER PULSES
摘要 A method for inspecting an object and detecting defects is taught ( BGA and Flip-Chip solder joints on a PCB particularly). The method comprises injecting a heat pulse by light beam at a selected point on the object; capturing a sequence of consecutive thermal images of the object to record heat diffusion over time resulting from the heat pulse; comparing the heat diffusion over time at the point on said object to a reference; and determining whether the object comprises any defects. An apparatus for performing the described method is also described.
申请公布号 WO0248720(A3) 申请公布日期 2002.10.03
申请号 WO2001CA01585 申请日期 2001.11.15
申请人 ART ADVANCED RESEARCH TECHNOLOGIES, INC / ART RECHERCHES ET TECHNOLOGIES AVANCEES, INC.;SCHLAGHECK, JERRY;PASTOR, MARC 发明人 SCHLAGHECK, JERRY;PASTOR, MARC
分类号 G01N25/72 主分类号 G01N25/72
代理机构 代理人
主权项
地址