发明名称 SAMPLE ANALYSIS AND SAMPLE OBSERVATION APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a sample analysis and sample observation apparatus for appropriately analyze or observe a sample even if the sample drifts. SOLUTION: A drift detection means 20 reads image data obtained before analysis from a memory M11 , and reads image data obtained during analysis from a memory M21 . The drift detection means 20 detects the amount and direction of drift of the sample using the image data. A comparison means 21 compares the amount of drift that has been detected with a threshold. The comparison means 21 compares the amount of drift that has been detected with a threshold. When it is judged that the amount of drift is smaller than the threshold by the comparison, a correction means 22 performs the deflection control of electron beams so that the sample drift that is detected by the drift detection means 20 is compensated. On the other hand, when it is judged that the amount of drift is larger than the threshold, the correction means 22 moves and controls the sample stage 15 so that sample drift that is detected by the drift detection means 20 is compensated.</p>
申请公布号 JP2002286663(A) 申请公布日期 2002.10.03
申请号 JP20010087752 申请日期 2001.03.26
申请人 JEOL LTD 发明人 SAKAI YUJI
分类号 G01N23/227;H01J37/147;H01J37/22;(IPC1-7):G01N23/227 主分类号 G01N23/227
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