| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a scan path test can be conducted at high speed. SOLUTION: This semiconductor integrated circuit including scan path circuits SC1 to SC4 is provided with first and second memory circuits M1 and M2 to store data to be supplied to scan path circuits SC1 and SC2 respectively, and a switching circuit SEL to supply in parallel a data that is stored in the second memory circuit M2, to a plurality of the scan path circuits SC1 and SC2 that are selected among circuits comprising the scan path circuits SC1 to SC4.
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