发明名称 |
NEGATIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN BY USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve the sensitivity and resolution of a chemically amplifying negative resist and to impart excellent post exposure delay property to the resist. SOLUTION: The negative resist composition contains (A) copolymers of alkali-soluble hydroxyl styrene and styrene, (B) halogen-containing triazine compounds which generate acids by irradiation of radiation and (C) at least one kind of crosslinking agent selected from melamine resin and urea resin in which the N-site atoms are substituted with methylol groups or alkoxy methyl groups or both of the groups. |
申请公布号 |
JP2002287359(A) |
申请公布日期 |
2002.10.03 |
申请号 |
JP20020066051 |
申请日期 |
2002.03.11 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
SATO MITSURU;OMORI KATSUMI;ISHIKAWA KIYOSHI;IGUCHI ETSUKO;KANEKO FUMITAKE |
分类号 |
G03F7/038;C08F212/06;C08F212/14;G03F7/004;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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