发明名称 Semiconductor device
摘要 A semiconductor device includes an AlGaN film formed on a GaN film on a substrate, a gate electrode formed on the AlGaN film, and source and drain electrodes formed on either side of the gate electrode on the AlGaN film. An n-type InxGayAl1-x-yN film is interposed between the source and drain electrodes and the AlGaN film. Alternatively, the semiconductor device includes an n-type InxGayAl1-x-yN film formed on a GaN film on a substrate, a gate electrode formed on the InxGayAl1-x-yN film, and source and drain electrodes formed on either side of the gate electrode on the InxGayAl1-x-yN film.
申请公布号 US2002139995(A1) 申请公布日期 2002.10.03
申请号 US20020059226 申请日期 2002.01.31
申请人 INOUE KAORU;IKEDA YOSHITO;MASATO HIROYUKI 发明人 INOUE KAORU;IKEDA YOSHITO;MASATO HIROYUKI
分类号 H01L21/205;H01L21/338;H01L29/20;H01L29/778;H01L29/812;(IPC1-7):H01L31/032;H01L31/033;H01L31/072;H01L31/109 主分类号 H01L21/205
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