| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a complex configuration, for example, for providing a correction circuit must be adopted since a proper value cannot be displaced if a magnetic angle does not match the elevation angle of a sensor when applied to a magnetic sensor in the conventional MI element structure. SOLUTION: An MI element is formed on an insulating substrate 2 as a magnetic thin film 3, and the insulating substrate is not at the same plane. In the magnetic thin film 3, an axis of easy magnetization is provided in a width direction in the case of a single-layer magnetic thin film, and the axes of easy magnetization of the magnetic thin film cross in the case of a double- layer lamination. The detection direction of the MI element 1 can be compensated as compared with the shape of the insulating substrate 2, thus accurately detecting magnetism.
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