发明名称 |
Method for cleaning substrate and apparatus therefor |
摘要 |
A substrate cleaning method and an apparatus therefor capable of increasing a particle removal ratio at which particles firmly adhering to a substrate are removed therefrom and increasing a throughput. A substrate such as a wafer or the like placed in a cleaning tank filled therein with a cleaning liquid is cleaned by an ultrasonic vibration. Cleaning of the substrate is carried out in such a manner that an ultrasonic vibration is applied to the substrate from a bottom of the cleaning tank, during which application the substrate is kept at a predetermined inclination angle with respect to a direction of acoustic streaming in the cleaning liquid formed by propagation of an ultrasonic wave.
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申请公布号 |
US2002139390(A1) |
申请公布日期 |
2002.10.03 |
申请号 |
US20010957119 |
申请日期 |
2001.09.20 |
申请人 |
OKANO SHOICHI;TAKAHASHI NORIHISA |
发明人 |
OKANO SHOICHI;TAKAHASHI NORIHISA |
分类号 |
B08B3/10;B08B3/12;H01L21/00;H01L21/304;(IPC1-7):B08B3/12 |
主分类号 |
B08B3/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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