Verlängerte Torsionshebel-Probe, Raster-Mikroskop, Informations-Aufnahme-Wiedergabe- Vorrichtung

摘要

A probe of torsion lever structure is provided with a flat-plate driving unit formed on a substrate with a gap therebetween, two beams positioned along a straight line parallel to the substrate and rotatably supporting the flat plate-shaped driving unit relative to the substrate, a drive device for driving the flat plate-shaped driving unit, and a tip for information input/output provided at an end of the flat plate-shaped driving unit. The two beams are provided at a position between the end of the flat plate-shaped driving unit and the other end thereof, closer to the other end than the center between the end and the other end of the flat plate-shaped driving unit. <IMAGE>