发明名称 METHOD OF SOLDERING CONTACT PIN, AND CONTACT PIN
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of soldering a contact pin by which contact pins are disposed in a plane at a narrow pitch, excellent maintainability is obtained, variance in height of inspection electrodes is sufficiently aborbed, stable contact with the inspection electrodes is obtained and a probe card enabling high-speed signal transmission is realized, and to provide a contact pin. SOLUTION: In this method of soldering contact pin in which the contact pin connected to and brought into contact with the inspection electrodes for a semiconductor chip in order to inspect the electric characteristic of the semiconductor chip is erected on a surface of a circuit board of the probe card, a soldering pedestal for the contact pin and solder balls are disposed close to each other on an electrode pad of the circuit board, the solder balls are melted to form a solder fillet between the electrode pad ad the soldering pedestal, and this soldering pedestal is fixed to the electrode pad.</p>
申请公布号 JP2002283049(A) 申请公布日期 2002.10.02
申请号 JP20010086191 申请日期 2001.03.23
申请人 ANDO ELECTRIC CO LTD 发明人 SUGIYAMA SHINICHI
分类号 G01R31/26;B23K1/00;B23K1/005;B23K3/06;B23K101/36;G01R1/073;H01L21/66;H01R4/02;H01R43/00;H05K3/34;(IPC1-7):B23K3/06 主分类号 G01R31/26
代理机构 代理人
主权项
地址