发明名称 Particle measurement method
摘要 <p>A particle measurement method includes the steps of: preparing a first suspension by suspending transparent particles in water, the transparent particles including particles generating a first surface potential in contact with water, preparing a second suspension by suspending opaque fine particles in water, the opaque fine particles including particles generating a second surface potential in contact with water, the first and second potentials differing in polarity, mixing the first suspension with the second suspension so that the opaque fine particles electrostatically adhere to the transparent particles and opaque the transparent particles, irradiating light to the opaqued particles to capture an image of each opaqued particle; and analyzing the captured image.</p>
申请公布号 EP1245945(A2) 申请公布日期 2002.10.02
申请号 EP20020252285 申请日期 2002.03.28
申请人 SYSMEX CORPORATION 发明人 SAKURAI, CHIKAKO;JINDO, KATSUHIKO
分类号 B01F3/12;G01N15/14;(IPC1-7):G01N15/14 主分类号 B01F3/12
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