发明名称 Apparatus and method for inspecting wiring on board
摘要 A magnetic field applying portion is positioned above a magnetic field applied region, and applies a magnetic field to the magnetic field applied region. Among probes which are abutted against ball grids of wirings, two probes are selectively connected electrically to a current detector section whereby a closed circuit is formed. This causes the closed circuit to carry an induced current as the magnetic flux through the magnetic field the magnetic field applied region changes with time. A current detector of the current detector section detects the value of the induced current, and whether there is a short-circuit is judged based on the detected current value.
申请公布号 US6459272(B1) 申请公布日期 2002.10.01
申请号 US20000575550 申请日期 2000.05.22
申请人 NIDEC-READ CORPORATION 发明人 YAMASHITA MUNEHIRO
分类号 G01R31/02;G01R31/28;G01R31/304;G01R31/315;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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