发明名称 |
Method and apparatus for correcting electronic offset and gain variations in a solid state X-ray detector |
摘要 |
A method and apparatus for correcting electronic offset and gain variations in solid state x-ray detectors includes dedicating rows at the end of an x-ray detector scan. The dedicated rows may be used to measure the "signal" induced by electronic offset and gain variations in solid state x-ray detectors. The first row may be used to measure the signal induced by electronic offset. The second row may be used to measure to signal induced by gain variations. Measurements of the induced signals taken from the dedicated rows may be used to eliminate structured artifacts from the x-ray image.
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申请公布号 |
US6457861(B1) |
申请公布日期 |
2002.10.01 |
申请号 |
US20000713730 |
申请日期 |
2000.11.15 |
申请人 |
GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC |
发明人 |
PETRICK SCOTT;NARASIMHAN SWAMI;VAFI HABIB |
分类号 |
G01T1/20;A61B6/00;A61B6/03;H01L27/14;H01L31/09;(IPC1-7):G01D18/00 |
主分类号 |
G01T1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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