Testing system for semiconductor device

摘要

A testing system for a semiconductor device having a tester carrying out a test for a semiconductor device, a host computer carrying out a repair analysis processing, a tester controller instructing the tester to operate the test and notifying the test result to the host computer. The host computer has a stay-and-resident program necessary for the analytical processing and sends those data to the tester controller in the point in which data showing "repairable or not" is detected.