发明名称 Twin MONOS memory cell usage for wide program
摘要 The present invention provides a method of memory cell selection and operation to obtain wide program bandwidth and EEPROM erase capability. Two storage sites within a memory cell can be simultaneously selected during read, program and erase. By proper biasing, each of the sites can be independently read and programmed. Also, during program, the source of energy to produce the current flow can be dynamically obtained from the stored charge on the selected bit line. If the bit line capacitance is not adequate to provide a charge that is necessary, additional bit line capacitance is borrowed from unselected bit lines, or a source follower select transistor may be used.
申请公布号 US6459622(B1) 申请公布日期 2002.10.01
申请号 US20020099030 申请日期 2002.03.15
申请人 HALO LSI, INC. 发明人 OGURA SEIKI;OGURA TOMOKO
分类号 G11C16/02;G11C16/04;G11C16/06;G11C16/10;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04 主分类号 G11C16/02
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