发明名称 Diffuse reflectance method and apparatus for determining thickness of an infrared translucent layer
摘要 A method for producing an interferogram of an infrared translucent layer that is on a reflective substrate, comprising generating parallel infrared interferometer beams by means of an infrared interferometer, converging the parallel infrared interferometer beams into converging infrared interferometer beams, sending the converging infrared interferometer beams onto the infrared translucent layer to produce diffusely reflected infrared interferometer rays from above and below the infrared translucent layer, and making the diffusely reflected infrared interferometer rays into parallel reflected infrared interferometer rays.
申请公布号 US6459488(B1) 申请公布日期 2002.10.01
申请号 US20000502059 申请日期 2000.02.10
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 HEFFNER KENNETH H.
分类号 G01B11/06;(IPC1-7):G01B9/02 主分类号 G01B11/06
代理机构 代理人
主权项
地址