发明名称 |
ASHING PROCESS FOR FORMING VIA CONTACT |
摘要 |
PURPOSE: An ashing process for forming a via contact is provided to remove effectively a TiN foot from a via profile or a polymer from a sidewall of a via contact. CONSTITUTION: A hard polymer is generated from a via contact sidewall in a via etch process. A photoresist/polymer is easily hardened when the hard polymer is contacted with a high temperature plate of 250 degrees centigrade. The photoresist is fully removed by using a mixed gas of O2+H2N2 or O2+N2 in a state of plasma. A wafer is loaded on the high temperature plate by a pin down method and a polymer is removed from the via contact sidewall by adding an etching gas such as a CF4 gas. A TiN foot is removed from a lower portion of the via contact by performing an isotropic etch process.
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申请公布号 |
KR20020074012(A) |
申请公布日期 |
2002.09.28 |
申请号 |
KR20010014091 |
申请日期 |
2001.03.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JIN GI;OH, SEUNG YEONG |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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