SEMICONDUCTOR TESTING DEVICE

摘要

PROBLEM TO BE SOLVED: To store many pieces of fail information by effectively using fail memory without increasing a memory capacity. SOLUTION: Concerning a semiconductor testing device, a prescribed pattern is inputted from the input pin of a semiconductor device to judge whether the pattern passes or fails from whether a value outputted from an output pin by the inputting and the result of judging is stored in a fail memory. The testing device can store much fail information by effectively using the fail memory without increasing a memory capacity, by storing only the fail information in the fail memory.