发明名称 METHOD FOR FORMING THIN FILM TRANSISTOR ON POLYCRYSTALLINE SILICON FILM MAINLY ORIENTED IN <100> PLANE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a TFT with use of a polycrystalline silicon film of more uniform crystallographic orientation and a method for manufacturing the TFT with use of polycrystalline silicon mainly oriented in &lt;100&gt;. SOLUTION: The method for forming a thin film transistor(TFT) structure on a substrate comprises a step of providing a substrate, a step of depositing an amorphous silicon film of at least 100 nm on the substrate, a step of annealing the amorphous silicon film to form polycrystalline silicon mainly having crystallographic orientation of &lt;100&gt;, using a transverse crystallizing process, a step of forming a gate structure on the polycrystalline film and a step of doping the polycrystalline silicon mainly having the crystallographic orientation of &lt;100&gt; to form a source region and a drain region.
申请公布号 JP2002280570(A) 申请公布日期 2002.09.27
申请号 JP20020027484 申请日期 2002.02.04
申请人 SHARP CORP 发明人 APOSTLOS BOUTOSASU
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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