发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which has a sure output tolerant function, even in the case with the integrated circuit formed by the elements of low breakdown voltage. SOLUTION: In the semiconductor integrated circuit provided with an output circuit equipped with an output MOSFET M1 connecting the source to a power supply node NV, to which a first power supply potential is supplied, a first MOSFET M3 for output tolerant to be turned on for conducting the gate and drain of the output MOSFET M1 when the supply of the first power supply potential is cut off and a second MOSFET M4 for output tolerant to be turned off for disconnecting the back gate of the output MOSFET M1 and the power supply node NV when the supply of the first power supply potential VCC is cut off and a voltage Vy is applied to an output terminal Y, an MOSFET M10 is provided for conducting the back gate and the gate of the output MOSFET M1 when the supply of the first power supply potential VCC is cut off.
申请公布号 JP2002280892(A) 申请公布日期 2002.09.27
申请号 JP20010074412 申请日期 2001.03.15
申请人 HITACHI LTD;HITACHI TOBU SEMICONDUCTOR LTD 发明人 TANAKA ISATO
分类号 H03K19/0175;(IPC1-7):H03K19/017 主分类号 H03K19/0175
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