发明名称 POWER SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a power semiconductor device having a temperature sensor whose malfunction can be suppressed even to such disturbances and noises as electromagnetic interference waves. SOLUTION: The power semiconductor device 10 comprises a power semiconductor element 40 formed on a substrate 11 and a temperature sensor 20 including at least one temperature sensing diode 30 formed on the substrate. In the power semiconductor device, there are made substantially equal to each other a capacitance formed between one region 16 of regions 16, 18 having different conduction types from each other which constitute the diode and a base region 38 of the semiconductor element, and a capacitance formed between the other region 18 of the regions 16, 18 having different conduction types from each other and the base region 38 of the semiconductor element.
申请公布号 JP2002280556(A) 申请公布日期 2002.09.27
申请号 JP20010082618 申请日期 2001.03.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 TOMOMATSU YOSHIFUMI
分类号 H01L27/06;H01L27/04;H01L29/739;H01L29/78;H01L29/861;H01L31/12;(IPC1-7):H01L29/78 主分类号 H01L27/06
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