发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To enable measuring skewness between data being minute which is not satisfied by measurement accuracy of a tester device and to measure skewness between data of the worst case in a plurality of operation cycle. SOLUTION: This device is provided with a timing deciding circuit 2 which compares and decides coincidence/uncoincidence of input data synchronized with two different timing and holds and outputs a test result based on the decided result.
申请公布号 JP2002279797(A) 申请公布日期 2002.09.27
申请号 JP20010075950 申请日期 2001.03.16
申请人 TOSHIBA CORP 发明人 HIRABAYASHI OSAMU
分类号 G01R31/28;G01R31/317;G11C7/10;G11C11/413;G11C29/48;G11C29/50;(IPC1-7):G11C29/00 主分类号 G01R31/28
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