发明名称 THIN FILM FORMING METHOD AND APPARATUS
摘要 <p>A semiconductor substrate (101) is placed in a predetermined processing vessel, and oxygen gas activated by, e.g., conversion into a plasma is supplied onto an insulating film (108). The surfaces of an interlevel insulating film (106) and insulating film (108) are exposed to the activated oxygen gas. After that, a ruthenium film (109) is formed by CVD.</p>
申请公布号 WO2002075011(A2) 申请公布日期 2002.09.26
申请号 JP2002002425 申请日期 2002.03.14
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