Repairing memory involves fault detection logic detecting faults during operation and permanently replacing faulty rows and/or columns with replacement rows and/or columns

摘要

The method involves fault detection logic (20) in the memory detecting faults and detecting faulty rows and/or columns in a memory cell field in the event of a fault. The memory has replacement rows and/or columns (32,34) and the fault detection logic permanently replaces the faulty rows and/or columns with the replacement rows and/or columns. Independent claims are also included for the following an arrangement for repairing a memory and fault monitoring logic.