发明名称 Plasma etcher with heated ash chamber base
摘要 A semiconductor manufacturing apparatus is described. That apparatus includes an ash chamber that has an ash chamber base, and a heating unit that is coupled to the ash chamber base. The heating unit applies heat to the ash chamber base to reduce deposition of residues onto ash chamber base surfaces, which could cause surface particle defects in a semiconductor device.
申请公布号 US2002137354(A1) 申请公布日期 2002.09.26
申请号 US20010818177 申请日期 2001.03.26
申请人 TIMPERIO ONOFIO L.;LUCA STEPHEN J. 发明人 TIMPERIO ONOFIO L.;LUCA STEPHEN J.
分类号 H01L21/00;(IPC1-7):C25F1/00;C25F3/30;C23F1/00;B44C1/22 主分类号 H01L21/00
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