| 摘要 |
With this invention, operation testing can be performed using general operation and emulation operation. With the MPU of this invention, using emulation operation, commands for transferring data between register with scanning function 104 and register without scanning function 103 are input by scanning to command register with scanning function 101. Next, using general operation, the command execution is performed. Following this, the data of register 104 with scanning function is read. With this invention, it is possible to provide a semiconductor integrated circuit with a small circuit scale and with a short time required for operation testing.
|
